Education:

• Ph.D. (Statistics), Iowa State University, August 1981
• M.S. (Statistics), Iowa State University, August 1979
• B.S. (Management Science), Georgia Institute of Technology, June 1977

Courses:

• ST 573 - Design of Experiments (Spring 2008)
  Comprehensive Exams
• ST 673 - Advanced Topics in Design of Experiments and Linear Models (Fall 2008)
• ST 201 - Introduction to Statistics (Fall 2007)
• ST 207 - Honors Introduction to Statistics (Spring 2008)

Honors:

• Lloyd Nelson award for best article for practitioners in Journal of Quality Technology for 2004.
• American Statistical Association Fellow, Elected 2002.

UTK College of Business Administration Honors:

• William B. Stokely Scholar, 2005-2006
• Greg Dobbins Outstanding Teaching and Research Award, 2003
• Alma and Hal Reagan Scholar, 1991-1993, 1999-2001
• Conferred the title of “Honorary Professor” of the Technical University of Timisoara, Romania, November 1999.
• William B. Fulbright grantee, Technical University of Timisoara, Romania, 1994-95.

Major Professional Activities:

• Technometrics Management Committee member, 1999-2004.
• Technometrics Associate Editor, 1992-1998.
• Journal of Quality Technology Editorial Review Board member, 1986-1991.
• Service for the American Statistical Association.
  
  -- Samuel S. Wilks Memorial Medal Committee member, 2005-current.
  -- Finance Committee member, 2002-2003.
  -- Q&P Section Program Chair, 1996.
  -- ASA/MAA Joint Committee on Undergraduate Statistics member, 1991-1993.

Recent and Forthcoming Publications:

• Mee, R. (2002), “Three-Level Simplex Designs and Their Use in Sequential Experimentation,” Journal of Quality Technology, 34, pp. 152-164.
• Li, H. and Mee, R. (2002), “Better Foldover Fractions for Designs,” Technometrics, 44, pp. 278-283.
• Block, R. and Mee, R. (2003), “Second Order Saturated Resolution IV Designs,” Journal of Statistical Theory and Applications, 2, pp. 96-112.
• Ren, S., Mee, R. and Frymier, P. (2004), “Using Factorial Experiments to Study the Toxicity of Metal Mixtures,” Ecotoxicology and Environmental Safety, 59, pp. 38-43.
• Mee, R. (2004), “Efficient Two-Level Designs for Estimating Main Effects and Two-Factor Interactions,” Journal of Quality Technology, 36, pp. 400-412.
• Block, R. and Mee, R. (2005), “Resolution IV Designs with 128 Runs,” Journal of Quality Technology, 37, 282-293.
• “Second Order Saturated Orthogonal Arrays of Strength Three” (with C.S. Cheng and O. Yee) accepted for publication in Statistica Sinica.
• “Optimal Three-Level Designs for Response Surfaces in Spherical Experimental Regions” accepted for publication in Journal of Quality Technology.

Significant Older Publications:

• Mee, R. and Owen, D. (1983), “Improved Factors for One-Sided Tolerance Limits for Balanced One-Way ANOVA Random Model,” Journal of the American Statistical Association, 78, pp. 901-905.
• Harville, D. and Mee, R. (1984), “A Mixed-Model Procedure for Analyzing Ordered Categorical Data,” Biometrics, 40, pp. 393-408.
• Mee, R. (1984), “b-Expectation and b-Content Tolerance Limits for Balanced One-Way ANOVA Random Model,” Technometrics, 26, pp. 251-254.
• Eberhardt, K., Mee, R., and Reeve, C. (1989), “Computing Factors for Exact Two-Sided Tolerance Limits for a Normal Distribution,” Communications in Statistics - Simulation and Computation, 18, pp. 397-413.
• Mee, R. (1990), “Confidence Intervals for Probabilities and Tolerance Regions Based on a Generalization of the Mann-Whitney Statistic,” Journal of the American Statistical Association, 85, pp. 793-800.
• Mee, R. and Chua, T. (1991), “Regression Toward the Mean and the Paired Sample t Test,” The American Statistician, 45, pp. 39-42.
• Mee, R., Eberhardt, K., and Reeve, C. (1991), “Calibration and Simultaneous Tolerance Intervals for Regression,” Technometrics, 33, pp. 211-219.
• Mee, R. and Eberhardt, K. (1996), “A Comparison of Criteria for Calibration Intervals,” Technometrics, 38, pp. 221-22.
• Mee, R. and Peralta, M. (2000), “Semifolding 2^k-p Designs,” Technometrics, 42, pp. 122-134.
• Mee, R. (2001), “Noncentral Composite Designs,” Technometrics, 43, pp. 34-43.

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