Dr. Robert Mee
Professor
Education:
- Ph.D. (Statistics), Iowa State University, August 1981
- M.S. (Statistics), Iowa State University, August 1979
- B.S. (Management Science), Georgia Institute of Technology, June 1977
Courses:
- ST 573 - Design of Experiments
(Spring 2008)
Comprehensive Exams - ST 673 - Advanced Topics in Design of Experiments and Linear Models (Fall 2008)
- ST 201 - Introduction to Statistics (Fall 2007)
- ST 207 - Honors Introduction to Statistics (Spring 2008)
Honors:
- Lloyd Nelson award for best article for practitioners in Journal of Quality Technology for 2004.
- American Statistical Association Fellow, Elected 2002.
UTK College of Business Administration Honors:
- William B. Stokely Scholar, 2005-2006
- Greg Dobbins Outstanding Teaching and Research Award, 2003
- Alma and Hal Reagan Scholar, 1991-1993, 1999-2001
- Conferred the title of “Honorary Professor” of the Technical University of Timisoara, Romania, November 1999.
- William B. Fulbright grantee, Technical University of Timisoara, Romania, 1994-95.
Major Professional Activities:
- Technometrics Management Committee member, 1999-2004.
- Technometrics Associate Editor, 1992-1998.
- Journal of Quality Technology Editorial Review Board member, 1986-1991.
- Service for the American Statistical Association.
-- Samuel S. Wilks Memorial Medal Committee member, 2005-current.
-- Finance Committee member, 2002-2003.
-- Q&P Section Program Chair, 1996.
-- ASA/MAA Joint Committee on Undergraduate Statistics member, 1991-1993.
Recent and Forthcoming Publications:
- Mee, R. (2002), “Three-Level Simplex Designs and Their Use in Sequential Experimentation,” Journal of Quality Technology, 34, pp. 152-164.
- Li, H. and Mee, R. (2002), “Better Foldover Fractions for Designs,” Technometrics, 44, pp. 278-283.
- Block, R. and Mee, R. (2003), “Second Order Saturated Resolution IV Designs,” Journal of Statistical Theory and Applications, 2, pp. 96-112.
- Ren, S., Mee, R. and Frymier, P. (2004), “Using Factorial Experiments to Study the Toxicity of Metal Mixtures,” Ecotoxicology and Environmental Safety, 59, pp. 38-43.
- Mee, R. (2004), “Efficient Two-Level Designs for Estimating Main Effects and Two-Factor Interactions,” Journal of Quality Technology, 36, pp. 400-412.
- Block, R. and Mee, R. (2005), “Resolution IV Designs with 128 Runs,” Journal of Quality Technology, 37, 282-293.
- “Second Order Saturated Orthogonal Arrays of Strength Three” (with C.S. Cheng and O. Yee) accepted for publication in Statistica Sinica.
- “Optimal Three-Level Designs for Response Surfaces in Spherical Experimental Regions” accepted for publication in Journal of Quality Technology.
Significant Older Publications:
- Mee, R. and Owen, D. (1983), “Improved Factors for One-Sided Tolerance Limits for Balanced One-Way ANOVA Random Model,” Journal of the American Statistical Association, 78, pp. 901-905.
- Harville, D. and Mee, R. (1984), “A Mixed-Model Procedure for Analyzing Ordered Categorical Data,” Biometrics, 40, pp. 393-408.
- Mee, R. (1984), “b-Expectation and b-Content Tolerance Limits for Balanced One-Way ANOVA Random Model,” Technometrics, 26, pp. 251-254.
- Eberhardt, K., Mee, R., and Reeve, C. (1989), “Computing Factors for Exact Two-Sided Tolerance Limits for a Normal Distribution,” Communications in Statistics - Simulation and Computation, 18, pp. 397-413.
- Mee, R. (1990), “Confidence Intervals for Probabilities and Tolerance Regions Based on a Generalization of the Mann-Whitney Statistic,” Journal of the American Statistical Association, 85, pp. 793-800.
- Mee, R. and Chua, T. (1991), “Regression Toward the Mean and the Paired Sample t Test,” The American Statistician, 45, pp. 39-42.
- Mee, R., Eberhardt, K., and Reeve, C. (1991), “Calibration and Simultaneous Tolerance Intervals for Regression,” Technometrics, 33, pp. 211-219.
- Mee, R. and Eberhardt, K. (1996), “A Comparison of Criteria for Calibration Intervals,” Technometrics, 38, pp. 221-22.
- Mee, R. and Peralta, M. (2000), “Semifolding 2k-p Designs,” Technometrics, 42, pp. 122-134.
- Mee, R. (2001), “Noncentral Composite Designs,” Technometrics, 43, pp. 34-43.
